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1 Ergebnisse
1
Attention Modules Improve Image-Level Anomaly Detection for..:
, In:
2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)
,
Vieira e Silva, Andre Luiz
;
Simoes, Francisco
;
Kowerko, Danny
... - p. 8231-8240 , 2024
Link:
https://doi.org/10.1109/WACV57701.2024.00806
RT T1 <cTitle>2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</cTitle>: T1 <Title>Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10483952&Exemplar=1&LAN=DE A1 Vieira e Silva, Andre Luiz A1 Simoes, Francisco A1 Kowerko, Danny A1 Schlosser, Tobias A1 Battisti, Felipe A1 Teichrieb, Veronica YR 2024 SN 2642-9381 K1 Visualization K1 Computer vision K1 Artificial neural networks K1 Inspection K1 Anomaly detection K1 Applications K1 Remote Sensing K1 Algorithms K1 Image recognition and understanding K1 Machine learning architectures K1 formulations K1 and algorithms SP 8231 OP 8240 LK http://dx.doi.org/https://doi.org/10.1109/WACV57701.2024.00806 DO https://doi.org/10.1109/WACV57701.2024.00806 SF ELIB - SuUB Bremen
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