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1 Ergebnisse
1
Deep Metric Learning with Chance Constraints:
, In:
2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)
,
Gurbuz, Yeti Z.
;
Can, Ogul
;
Alatan, A. Aydin
- p. 532-542 , 2024
Link:
https://doi.org/10.1109/WACV57701.2024.00060
RT T1 <cTitle>2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</cTitle>: T1 <Title>Deep Metric Learning with Chance Constraints</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10484253&Exemplar=1&LAN=DE A1 Gurbuz, Yeti Z. A1 Can, Ogul A1 Alatan, A. Aydin YR 2024 SN 2642-9381 K1 Measurement K1 Greedy algorithms K1 Computer vision K1 Codes K1 Benchmark testing K1 Approximation algorithms K1 Iterative algorithms K1 Algorithms K1 Image recognition and understanding K1 Machine learning architectures K1 formulations K1 and algorithms SP 532 OP 542 LK http://dx.doi.org/https://doi.org/10.1109/WACV57701.2024.00060 DO https://doi.org/10.1109/WACV57701.2024.00060 SF ELIB - SuUB Bremen
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