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1 Ergebnisse
1
Determining GaN HEMT Trap Models from MHz Load-Line Measure..:
, In:
2024 15th German Microwave Conference (GeMiC)
,
Rudolph, Matthias
;
Beleniotis, Petros
;
Zervos, Christos
.. - p. 29-32 , 2024
Link:
https://doi.org/10.23919/GeMiC59120.2024.10485297
RT T1
2024 15th German Microwave Conference (GeMiC)
: T1
Determining GaN HEMT Trap Models from MHz Load-Line Measurement – A Case Study
UL https://suche.suub.uni-bremen.de/peid=ieee-10485297&Exemplar=1&LAN=DE A1 Rudolph, Matthias A1 Beleniotis, Petros A1 Zervos, Christos A1 Rohde, Ulrich L. A1 Andrei, Cristina YR 2024 K1 Microwave measurement K1 Voltage measurement K1 Pulse measurements K1 Area measurement K1 HEMTs K1 Gain measurement K1 Numerical models K1 Compact transistor modeling K1 GaN K1 model parameter extraction K1 ASM-HEMT SP 29 OP 32 LK http://dx.doi.org/https://doi.org/10.23919/GeMiC59120.2024.10485297 DO https://doi.org/10.23919/GeMiC59120.2024.10485297 SF ELIB - SuUB Bremen
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