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1 Ergebnisse
1
Studies of Atomic Force Microscopy and Application in Advan..:
, In:
2023 24th International Conference on Electronic Packaging Technology (ICEPT)
,
Hua, Younan
;
Liao, Lois
;
Zhu, Lei
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICEPT59018.2023.10491952
RT T1 <cTitle>2023 24th International Conference on Electronic Packaging Technology (ICEPT)</cTitle>: T1 <Title>Studies of Atomic Force Microscopy and Application in Advanced Packaging, Materials Characterization and Failure Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10491952&Exemplar=1&LAN=DE A1 Hua, Younan A1 Liao, Lois A1 Zhu, Lei A1 Zhang, Linhua A1 Luo, Xiaodan A1 Zhao, Yanfei A1 Wu, Meihua A1 Li, Xiaomin YR 2023 SN 2836-9734 K1 Atomic measurements K1 Weight measurement K1 Atomic force microscopy K1 Force K1 Surface morphology K1 Morphology K1 Failure analysis K1 Advanced packaging K1 Hardness SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEPT59018.2023.10491952 DO https://doi.org/10.1109/ICEPT59018.2023.10491952 SF ELIB - SuUB Bremen
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