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Study on the effect of solder flux on the reliability of ce..:

, In: 2023 24th International Conference on Electronic Packaging Technology (ICEPT),
Yang, Zhen-tao ; Yu, Fei ; Chen, Jiang-tao. - p. 1-4 , 2023
Link: https://doi.org/10.1109/ICEPT59018.2023.10492163