I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Finite Element Simulation Study of the Effects of Kirkendal..:
, In:
2023 24th International Conference on Electronic Packaging Technology (ICEPT)
,
Luo, Ming-Sheng
;
Wang, Hong-Guang
;
Chen, Bin
.. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ICEPT59018.2023.10492349
RT T1 <cTitle>2023 24th International Conference on Electronic Packaging Technology (ICEPT)</cTitle>: T1 <Title>Finite Element Simulation Study of the Effects of Kirkendall Voids in IMC Layer on Interfacial Crack and Reliability of Cu–Sn Solder Joint</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10492349&Exemplar=1&LAN=DE A1 Luo, Ming-Sheng A1 Wang, Hong-Guang A1 Chen, Bin A1 Lyu, Guang-Chao A1 Zhang, Xin-Ping YR 2023 SN 2836-9734 K1 Three-dimensional displays K1 Simulation K1 Aggregates K1 Market research K1 Finite element analysis K1 Reliability K1 Intermetallic K1 IMC K1 Kirkendall void K1 Crack propagation SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICEPT59018.2023.10492349 DO https://doi.org/10.1109/ICEPT59018.2023.10492349 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
