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1 Ergebnisse
1
Research on Test Parameters of Ultra High Resolution CMOS I..:
, In:
2023 2nd International Conference on Automation, Robotics and Computer Engineering (ICARCE)
,
Tian, Yu
;
Liu, Pei
;
Rui, Erming
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ICARCE59252.2024.10492516
RT T1 <cTitle>2023 2nd International Conference on Automation, Robotics and Computer Engineering (ICARCE)</cTitle>: T1 <Title>Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10492516&Exemplar=1&LAN=DE A1 Tian, Yu A1 Liu, Pei A1 Rui, Erming A1 Jiao, Qiang A1 Xiong, Yuanyuan A1 Dong, Yanlei A1 Ma, Yue A1 Li, Junlin YR 2023 K1 Micromechanical devices K1 Image quality K1 Visualization K1 Image resolution K1 Target recognition K1 CMOS image sensors K1 Apertures K1 Ultra high resolution K1 CMOS image sensor microsystem K1 test parameter K1 geometric parameters K1 multi-objective identification of complex scenes SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICARCE59252.2024.10492516 DO https://doi.org/10.1109/ICARCE59252.2024.10492516 SF ELIB - SuUB Bremen
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