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1 Ergebnisse
1
Temperature-Sensitive Electrical Parameters of SiC MOSFET P..:
, In:
2023 3rd International Conference on Electrical Engineering and Control Science (IC2ECS)
,
Wei, Yunpeng
;
Jia, Jiayi
;
Wang, Zhou
.. - p. 1614-1619 , 2023
Link:
https://doi.org/10.1109/IC2ECS60824.2023.10493304
RT T1 <cTitle>2023 3rd International Conference on Electrical Engineering and Control Science (IC2ECS)</cTitle>: T1 <Title>Temperature-Sensitive Electrical Parameters of SiC MOSFET Power Module and its Application in Junction Temperature Evaluation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10493304&Exemplar=1&LAN=DE A1 Wei, Yunpeng A1 Jia, Jiayi A1 Wang, Zhou A1 Wu, Yuntao A1 Wu, Junke YR 2023 K1 Temperature measurement K1 MOSFET K1 Semiconductor device measurement K1 Temperature K1 Silicon carbide K1 Multichip modules K1 Thermistors K1 SiC MOSFET power modules K1 Thermistor parameters K1 NTC Thermistor K1 Junction temperature evaluation SP 1614 OP 1619 LK http://dx.doi.org/https://doi.org/10.1109/IC2ECS60824.2023.10493304 DO https://doi.org/10.1109/IC2ECS60824.2023.10493304 SF ELIB - SuUB Bremen
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