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1 Ergebnisse
1
Fault-Tolerant Control of IGBT Open-Circuit Failure in Five..:
, In:
2023 3rd International Conference on Electrical Engineering and Control Science (IC2ECS)
,
Zhuang, Deyu
;
Liu, Yunlong
;
Wu, Shijun
. - p. 1317-1322 , 2023
Link:
https://doi.org/10.1109/IC2ECS60824.2023.10493687
RT T1 <cTitle>2023 3rd International Conference on Electrical Engineering and Control Science (IC2ECS)</cTitle>: T1 <Title>Fault-Tolerant Control of IGBT Open-Circuit Failure in Five-Level Nested Neutral Point Piloted Converters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10493687&Exemplar=1&LAN=DE A1 Zhuang, Deyu A1 Liu, Yunlong A1 Wu, Shijun A1 Huang, Guangzhong YR 2023 K1 Insulated gate bipolar transistors K1 Fault diagnosis K1 Space vector pulse width modulation K1 Fault tolerance K1 Fault tolerant systems K1 Capacitors K1 Bridge circuits K1 open-circuit fault K1 fault tolerance control K1 nested neutral point pilot converter K1 model predictive control K1 modulation SP 1317 OP 1322 LK http://dx.doi.org/https://doi.org/10.1109/IC2ECS60824.2023.10493687 DO https://doi.org/10.1109/IC2ECS60824.2023.10493687 SF ELIB - SuUB Bremen
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