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Deep Learning for Microstructure Segmentation and Defect De..:

, In: 2023 IEEE International Conferences on Internet of Things (iThings) and IEEE Green Computing & Communications (GreenCom) and IEEE Cyber, Physical & Social Computing (CPSCom) and IEEE Smart Data (SmartData) and IEEE Congress on Cybermatics (Cybermatics),

Gu, Zhaochen ; Karri, Venkata Mani Krishna ; Sharma, Shashank... - p. 592-599 , 2023

Link: https://doi.org/10.1109/iThings-GreenCom-CPSCom-SmartD..

RT 
T1 <cTitle>2023 IEEE International Conferences on Internet of Things (iThings) and IEEE Green Computing & Communications (GreenCom) and IEEE Cyber, Physical & Social Computing (CPSCom) and IEEE Smart Data (SmartData) and IEEE Congress on Cybermatics (Cybermatics)</cTitle>: T1 <Title>Deep Learning for Microstructure Segmentation and Defect Detection in Additive Manufacturing Systems</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10501801&Exemplar=1&LAN=DE
				
A1 Gu, Zhaochen
A1 Karri, Venkata Mani Krishna
A1 Sharma, Shashank
A1 Tran, Hang
A1 Manjunath, Aishwarya
A1 Chen, Donger
A1 Fu, Song
A1 Dahotre, Narendra B.
YR 2023
SN 2836-3701
K1 Deep learning
K1 Image segmentation
K1 Adaptation models
K1 Computational modeling
K1 Network architecture
K1 Three-dimensional printing
K1 Transformers
K1 Deep Learning
K1 Additive Manufacturing
K1 Data Analytics
K1 Segmentation
K1 Defect Detection
K1 Process Optimization
K1 Microstructure
SP 592
OP 599
LK http://dx.doi.org/https://doi.org/10.1109/iThings-GreenCom-CPSCom-SmartData-Cybermatics60724.2023.00110
DO https://doi.org/10.1109/iThings-GreenCom-CPSCom-SmartData-Cybermatics60724.2023.00110
SF ELIB - SuUB Bremen

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