I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

IoT Defect Prediction Using AI Framework: A Review:

, In: 2023 Third International Conference on Ubiquitous Computing and Intelligent Information Systems (ICUIS),
A, Bhuvaneshwaran ; C, Deisy ; J, Sri Thrishna - p. 376-383 , 2023
Link: https://doi.org/10.1109/ICUIS60567.2023.00069