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1 Ergebnisse
1
IoT Defect Prediction Using AI Framework: A Review:
, In:
2023 Third International Conference on Ubiquitous Computing and Intelligent Information Systems (ICUIS)
,
A, Bhuvaneshwaran
;
C, Deisy
;
J, Sri Thrishna
- p. 376-383 , 2023
Link:
https://doi.org/10.1109/ICUIS60567.2023.00069
RT T1
2023 Third International Conference on Ubiquitous Computing and Intelligent Information Systems (ICUIS)
: T1
IoT Defect Prediction Using AI Framework: A Review
UL https://suche.suub.uni-bremen.de/peid=ieee-10506027&Exemplar=1&LAN=DE A1 A, Bhuvaneshwaran A1 C, Deisy A1 J, Sri Thrishna YR 2023 K1 Support vector machines K1 Measurement K1 Reviews K1 NASA K1 Machine learning K1 Predictive models K1 Ubiquitous computing K1 Software defects K1 Classifier K1 Error detection K1 Bugs K1 Software failure K1 Software fault SP 376 OP 383 LK http://dx.doi.org/https://doi.org/10.1109/ICUIS60567.2023.00069 DO https://doi.org/10.1109/ICUIS60567.2023.00069 SF ELIB - SuUB Bremen
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