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A Holistic Approach for Characterization of SET Effects in ..:
, In:
2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS)
,
Andjelkovic, Marko
;
Krstic, Milos
- p. 1-5 , 2024
Link:
https://doi.org/10.1109/LASCAS60203.2024.10506165
RT T1 <cTitle>2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS)</cTitle>: T1 <Title>A Holistic Approach for Characterization of SET Effects in a Standard Digital Cell Library</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10506165&Exemplar=1&LAN=DE A1 Andjelkovic, Marko A1 Krstic, Milos YR 2024 SN 2473-4667 K1 Semiconductor device modeling K1 Analytical models K1 Single event transients K1 Sensitivity K1 Databases K1 Voltage K1 Data models K1 Single Event Transients (SET) K1 SET mitigation K1 SPICE simulations K1 standard combinational cells SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/LASCAS60203.2024.10506165 DO https://doi.org/10.1109/LASCAS60203.2024.10506165 SF ELIB - SuUB Bremen
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