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1 Ergebnisse
1
Fault-Simulation-Based Flip-Flop Classification for Reverse..:
, In:
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
,
Mildner, Michael
;
Brunner, Michaela
;
Gruber, Michael
.. - p. 53-56 , 2024
Link:
https://doi.org/10.1109/DDECS60919.2024.10508905
RT T1 <cTitle>2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)</cTitle>: T1 <Title>Fault-Simulation-Based Flip-Flop Classification for Reverse Engineering</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10508905&Exemplar=1&LAN=DE A1 Mildner, Michael A1 Brunner, Michaela A1 Gruber, Michael A1 Baehr, Johanna A1 Sigl, Georg YR 2024 SN 2473-2117 K1 Ciphers K1 Reverse engineering K1 Logic gates K1 Security K1 Flip-flops K1 Flip-Flop Classification K1 Fault Simulation K1 Block Cipher K1 Hardware Reverse Engineering SP 53 OP 56 LK http://dx.doi.org/https://doi.org/10.1109/DDECS60919.2024.10508905 DO https://doi.org/10.1109/DDECS60919.2024.10508905 SF ELIB - SuUB Bremen
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