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1 Ergebnisse
1
A New Reliability Analysis of RISC-V Soft Processor for Saf..:
, In:
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
,
Cora, Giorgio
;
De Sio, Corrado
;
Rizzieri, Daniele
.. - p. 31-36 , 2024
Link:
https://doi.org/10.1109/DDECS60919.2024.10508921
RT T1 <cTitle>2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)</cTitle>: T1 <Title>A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10508921&Exemplar=1&LAN=DE A1 Cora, Giorgio A1 De Sio, Corrado A1 Rizzieri, Daniele A1 Azimi, Sarah A1 Sterpone, Luca YR 2024 SN 2473-2117 K1 Fault diagnosis K1 Program processors K1 Costs K1 Mission critical systems K1 Layout K1 Fault Injection K1 FPGA K1 Reliability K1 RISC-V K1 Robustness K1 Single Event Upset K1 Soft Errors SP 31 OP 36 LK http://dx.doi.org/https://doi.org/10.1109/DDECS60919.2024.10508921 DO https://doi.org/10.1109/DDECS60919.2024.10508921 SF ELIB - SuUB Bremen
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