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1 Ergebnisse
1
A Quad-Slope 70V GaN Gate Driver with Integrated Three-Mode..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Liu, Tianqi
;
Gao, Qiang
;
Martins, Rui P.
. - p. 1141-1145 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509138
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>A Quad-Slope 70V GaN Gate Driver with Integrated Three-Mode Level Shifter for Enhanced Negative Voltage Tolerance, dV/dt Detection and Double-Edge Self-Triggered Delay Compensation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509138&Exemplar=1&LAN=DE A1 Liu, Tianqi A1 Gao, Qiang A1 Martins, Rui P. A1 Lu, Yan YR 2024 SN 2470-6647 K1 Voltage measurement K1 Noise K1 Electromagnetic interference K1 Circuits K1 Logic gates K1 Gate drivers K1 Robustness K1 Gate driver K1 GaN K1 negative voltage K1 dV/dt detection K1 delay compensation SP 1141 OP 1145 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509138 DO https://doi.org/10.1109/APEC48139.2024.10509138 SF ELIB - SuUB Bremen
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