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1 Ergebnisse
1
Overshoot Dynamics in Parallel Connectivity Enabled Multile..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Zhang, Jinshui
;
Al Munefi, Majed
;
Peterchev, Angel V
. - p. 581-586 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509299
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Overshoot Dynamics in Parallel Connectivity Enabled Multilevel Converters: Generalized Analytic Expression and Impact Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509299&Exemplar=1&LAN=DE A1 Zhang, Jinshui A1 Al Munefi, Majed A1 Peterchev, Angel V A1 Goetz, Stefan M YR 2024 SN 2470-6647 K1 Temperature measurement K1 Multilevel converters K1 Voltage measurement K1 Energy exchange K1 Thermal analysis K1 Transistors K1 Stress K1 switch-capacitor circuit K1 overshoot dynamics K1 multilevel converters K1 parallel connection electrical stress SP 581 OP 586 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509299 DO https://doi.org/10.1109/APEC48139.2024.10509299 SF ELIB - SuUB Bremen
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