I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Experimental Characterization of Dynamic COSS Losses in 600..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
De Filippis, Stefano
;
Kasper, Matthias J.
;
Pacini, Alex
.. - p. 754-760 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509304
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Experimental Characterization of Dynamic COSS Losses in 600 V GaN HEMTs based on a Novel and Simple Calorimetric Method</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509304&Exemplar=1&LAN=DE A1 De Filippis, Stefano A1 Kasper, Matthias J. A1 Pacini, Alex A1 Sanz-Alcaine, Jose Miguel A1 Deboy, Gerald YR 2024 SN 2470-6647 K1 Temperature measurement K1 Semiconductor device measurement K1 Switching frequency K1 HEMTs K1 Loss measurement K1 Time measurement K1 Power electronics K1 Gallium Nitride (GaN) K1 High Electron-Mobility Transistors (HEMTs) K1 Output Capacitance (COSS) Losses K1 Soft-Switching Losses K1 Calorimetry K1 Calorimetric Measurement Method SP 754 OP 760 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509304 DO https://doi.org/10.1109/APEC48139.2024.10509304 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
