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1 Ergebnisse
1
Evaluation of GaN HEMT dv/dt Immunity and dv/dt Induced Fal..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Perera, Nirmana
;
Ledins, Kaspars
;
Fung, Sheung Wai
... - p. 729-736 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509328
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Evaluation of GaN HEMT dv/dt Immunity and dv/dt Induced False Turn-On Energy Loss</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509328&Exemplar=1&LAN=DE A1 Perera, Nirmana A1 Ledins, Kaspars A1 Fung, Sheung Wai A1 Efthymiou, Loizos A1 Mukherjee, Kalparupa A1 Findlay, John A1 Comiskey, Peter YR 2024 SN 2470-6647 K1 Energy loss K1 Voltage measurement K1 Silicon carbide K1 Bridge circuits K1 Switches K1 Logic gates K1 HEMTs SP 729 OP 736 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509328 DO https://doi.org/10.1109/APEC48139.2024.10509328 SF ELIB - SuUB Bremen
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