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1 Ergebnisse
1
An Experimental Technique for Detecting False Turn-on of Si..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Mandal, Manish
;
Roy, Shamibrota K
;
Basu, Kaushik
- p. 2456-2460 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509367
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>An Experimental Technique for Detecting False Turn-on of SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509367&Exemplar=1&LAN=DE A1 Mandal, Manish A1 Roy, Shamibrota K A1 Basu, Kaushik YR 2024 SN 2470-6647 K1 Resistance K1 MOSFET K1 Voltage measurement K1 Silicon carbide K1 Switches K1 Logic gates K1 SPICE K1 False turn-on K1 crosstalk K1 detection K1 SiC MOS-FET K1 DPT K1 Experiment SP 2456 OP 2460 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509367 DO https://doi.org/10.1109/APEC48139.2024.10509367 SF ELIB - SuUB Bremen
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