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1 Ergebnisse
1
Localization of Open-Circuit Faults in GaN-Based Three-Phas..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Sa, Satyam
;
Han, Yi
;
Assadi, Seyed Amir
.. - p. 461-467 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509409
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Localization of Open-Circuit Faults in GaN-Based Three-Phase Dual Active Bridge Converters with Reduced Sensing Requirements</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509409&Exemplar=1&LAN=DE A1 Sa, Satyam A1 Han, Yi A1 Assadi, Seyed Amir A1 Shawkat Zaman, Mohammad A1 Trescases, Olivier YR 2024 SN 2470-6647 K1 Location awareness K1 Heuristic algorithms K1 Noise K1 Fault tolerant systems K1 Prototypes K1 Switches K1 Power electronics SP 461 OP 467 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509409 DO https://doi.org/10.1109/APEC48139.2024.10509409 SF ELIB - SuUB Bremen
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