I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Aging Modeling and Simulation of the Gate Switching Instabi..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Garcia-Mere, Juan R.
;
Gomez, Alexis A.
;
Roig-Guitart, Jaume
.. - p. 653-658 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509430
RT T1
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
: T1
Aging Modeling and Simulation of the Gate Switching Instability Degradation in SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-10509430&Exemplar=1&LAN=DE A1 Garcia-Mere, Juan R. A1 Gomez, Alexis A. A1 Roig-Guitart, Jaume A1 Rodriguez, Juan A1 Rodriguez, Alberto YR 2024 SN 2470-6647 K1 Degradation K1 MOSFET K1 Adaptation models K1 Silicon carbide K1 Computational modeling K1 Switches K1 Logic gates K1 reliability K1 device modeling K1 Silicon Carbide (SiC) K1 Gate Switching Instability (GSI) K1 MOSFETs K1 threshold voltage SP 653 OP 658 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509430 DO https://doi.org/10.1109/APEC48139.2024.10509430 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)