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1 Ergebnisse
1
Variable Gate Current Range Digital Gate Driver IC Always P..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Zhou, Haoxi
;
Inuma, Toshiaki
;
Zhang, Dibo
.. - p. 1125-1129 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509445
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Variable Gate Current Range Digital Gate Driver IC Always Providing 6-bit Controllability in Various IGBTs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509445&Exemplar=1&LAN=DE A1 Zhou, Haoxi A1 Inuma, Toshiaki A1 Zhang, Dibo A1 Hata, Katsuhiro A1 Takamiya, Makoto YR 2024 SN 2470-6647 K1 Insulated gate bipolar transistors K1 Resistors K1 Technological innovation K1 Power measurement K1 Noise K1 Logic gates K1 Gate drivers K1 IGBT K1 IC K1 surge current K1 energy loss K1 active gate driver SP 1125 OP 1129 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509445 DO https://doi.org/10.1109/APEC48139.2024.10509445 SF ELIB - SuUB Bremen
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