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Measurement of Circuit Parasitics of a 200kW SiC based Stac:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Mazumder, Surjakanta
;
Mandal, Manish
;
M, Bharath Kumar
... - p. 1120-1124 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509473
RT T1 <cTitle>2024 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Measurement of Circuit Parasitics of a 200kW SiC based Stack</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10509473&Exemplar=1&LAN=DE A1 Mazumder, Surjakanta A1 Mandal, Manish A1 M, Bharath Kumar A1 G, Malingu A1 Roy, Shamibrota Kishore A1 Basu, Kaushik YR 2024 SN 2470-6647 K1 Power system measurements K1 Power measurement K1 Silicon carbide K1 Multichip modules K1 Estimation K1 Inverters K1 Finite element analysis K1 SiC Stack K1 Parasitic Inductance Measurement K1 Ansys Q3D Extractor SP 1120 OP 1124 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509473 DO https://doi.org/10.1109/APEC48139.2024.10509473 SF ELIB - SuUB Bremen
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