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1 Ergebnisse
1
Exceptional Gate Overvoltage Robustness in P-Gate GaN HEMT ..:
, In:
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Wang, Bixuan
;
Song, Qihao
;
Mukherjee, Kalparupa
... - p. 761-766 , 2024
Link:
https://doi.org/10.1109/APEC48139.2024.10509533
RT T1
2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
: T1
Exceptional Gate Overvoltage Robustness in P-Gate GaN HEMT with Integrated Circuit Interface
UL https://suche.suub.uni-bremen.de/peid=ieee-10509533&Exemplar=1&LAN=DE A1 Wang, Bixuan A1 Song, Qihao A1 Mukherjee, Kalparupa A1 Efthymiou, Loizos A1 Popa, Daniel A1 Longobardi, Giorgia A1 Udrea, Florin A1 Zhang, Yuhao YR 2024 SN 2470-6647 K1 Integrated circuits K1 Surge protection K1 Switches K1 Logic gates K1 HEMTs K1 Robustness K1 Voltage control K1 GaN HEMT K1 monolithic IC interface K1 gate reliability K1 robustness K1 gate spike K1 ringing K1 power switching SP 761 OP 766 LK http://dx.doi.org/https://doi.org/10.1109/APEC48139.2024.10509533 DO https://doi.org/10.1109/APEC48139.2024.10509533 SF ELIB - SuUB Bremen
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