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1 Ergebnisse
1
Revealing Unique Scaling Effects of Random Telegraph Noise ..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Goda, Akira
;
Matsui, Chihiro
;
Takeuchi, Ken
- p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511365
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Revealing Unique Scaling Effects of Random Telegraph Noise and Electron Injection Stochasticity in Stochastic Resonance with Floating Gate-based Neurons</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511365&Exemplar=1&LAN=DE A1 Goda, Akira A1 Matsui, Chihiro A1 Takeuchi, Ken YR 2024 K1 Error analysis K1 Stochastic resonance K1 Computational modeling K1 Neurons K1 Noise K1 Stochastic processes K1 Brain modeling SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511365 DO https://doi.org/10.1109/EDTM58488.2024.10511365 SF ELIB - SuUB Bremen
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