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Impact of Co-Integration on the Performance of Full CMOS Ba..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Singh, Sujit Kumar
;
Sharma, Deepesh
;
Srinivasan, P.
. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511467
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Impact of Co-Integration on the Performance of Full CMOS Based Hybrid SET-FET Circuits for Scalable Quantum Computing using FinFET Technologies</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511467&Exemplar=1&LAN=DE A1 Singh, Sujit Kumar A1 Sharma, Deepesh A1 Srinivasan, P. A1 Dixit, Abhisek YR 2024 K1 Performance evaluation K1 Temperature distribution K1 Quantum computing K1 Field effect transistors K1 Machine learning K1 FinFETs K1 CMOS technology K1 Hybrid SET-FET K1 Bulk FinFET K1 Machine Learning K1 co-integration SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511467 DO https://doi.org/10.1109/EDTM58488.2024.10511467 SF ELIB - SuUB Bremen
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