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1 Ergebnisse
1
Ultra-High Endurance (>1012) and High Drive-Current Selecto..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Matsushima, Yosuke
;
Iwasaki, Takeshi
;
Daibou, Tadaomi
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511529
RT T1
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
: T1
Ultra-High Endurance (>1012) and High Drive-Current Selector in Sub-30nmΦ Cell using Stable Oxide Doped with As-Se Free High Melting-Point Compound
UL https://suche.suub.uni-bremen.de/peid=ieee-10511529&Exemplar=1&LAN=DE A1 Matsushima, Yosuke A1 Iwasaki, Takeshi A1 Daibou, Tadaomi A1 Sasaki, Takayuki A1 Shimoda, Yutaro A1 Qi, Zhu A1 Goto, Masakazu A1 Sato, Yuya A1 Onizaki, Makoto A1 Nagamine, Makoto A1 Amano, Minoru A1 Kawai, Hiroki A1 Tokuhira, Hiroki A1 Chokawa, Kenta A1 Takashima, Rina A1 Tsukagoshi, Takayuki A1 Saitoh, Masumi A1 Ikeda, Keiji A1 Komatsu, Katsuyoshi YR 2024 K1 Temperature distribution K1 Temperature dependence K1 Voltage measurement K1 Photonic band gap K1 Scalability K1 Optical variables measurement K1 Compounds K1 Selector K1 As-Se free K1 endurance K1 and SCM SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511529 DO https://doi.org/10.1109/EDTM58488.2024.10511529 SF ELIB - SuUB Bremen
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