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1 Ergebnisse
1
Gate Leakage Current Analysis using Bayesian Deconvolution ..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Singh, Shivendra Kumar
;
Wu, Tian-Li
;
Chauhan, Yogesh Singh
- p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511595
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Gate Leakage Current Analysis using Bayesian Deconvolution for Accurate Electron/Hole Trapping Characterizations in 4H-SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511595&Exemplar=1&LAN=DE A1 Singh, Shivendra Kumar A1 Wu, Tian-Li A1 Chauhan, Yogesh Singh YR 2024 K1 Electron traps K1 Voltage measurement K1 Logic gates K1 Time measurement K1 Threshold voltage K1 Bayes methods K1 Iterative methods K1 4H-SiC K1 hole traps K1 electron traps K1 gate leakage K1 trap characterization SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511595 DO https://doi.org/10.1109/EDTM58488.2024.10511595 SF ELIB - SuUB Bremen
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