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1 Ergebnisse
1
Experimental Studies of Extended Drain MOSFET in 130-nm SOI..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Paul, Binoy Kumar
;
Gedela, Santosh Kumar
;
Toh, Rui Tze
. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511627
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Experimental Studies of Extended Drain MOSFET in 130-nm SOI Technology for Power Amplifier Design</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511627&Exemplar=1&LAN=DE A1 Paul, Binoy Kumar A1 Gedela, Santosh Kumar A1 Toh, Rui Tze A1 Vanukuru, Venkata YR 2024 K1 Performance evaluation K1 Wireless communication K1 Semiconductor device measurement K1 MOSFET K1 Power measurement K1 Power amplifiers K1 Silicon K1 WiFi K1 power amplifier K1 on chip K1 CMOS K1 efficiency K1 wireless communication K1 integration K1 RFIC SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511627 DO https://doi.org/10.1109/EDTM58488.2024.10511627 SF ELIB - SuUB Bremen
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