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1 Ergebnisse
1
An Interpretable Symbolic Regression Model for Prediction o..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Singh, Smriti
;
Ashai, Aasim
;
Mukherjee, Ankita
.. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511685
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>An Interpretable Symbolic Regression Model for Prediction of GaN Vertical Power MOSFET Failsafe Boundaries</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511685&Exemplar=1&LAN=DE A1 Singh, Smriti A1 Ashai, Aasim A1 Mukherjee, Ankita A1 Pramanik, Tanmoy A1 Sarkar, Biplab YR 2024 K1 Semiconductor device modeling K1 MOSFET K1 Computational modeling K1 Voltage K1 Logic gates K1 Predictive models K1 Power transistors K1 GaN K1 Vertical transistors K1 Potential barrier K1 Genetic algorithms K1 Symbolic regression SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511685 DO https://doi.org/10.1109/EDTM58488.2024.10511685 SF ELIB - SuUB Bremen
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