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1 Ergebnisse
1
Impact of Back End of Line (BEOL) and Ambient Temperature o..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Kumar, Nitish
;
Gupta, Karan
;
Gupta, Ayush
.. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511833
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Impact of Back End of Line (BEOL) and Ambient Temperature on Self-Heating in Twin Nanowire Gate-All-Around FETs: Junctionless Mode Versus Inversion Mode</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511833&Exemplar=1&LAN=DE A1 Kumar, Nitish A1 Gupta, Karan A1 Gupta, Ayush A1 Gupta, Ankur A1 Singh, Pushpapraj YR 2024 K1 Performance evaluation K1 Three-dimensional displays K1 Thermal resistance K1 Field effect transistors K1 Gallium arsenide K1 Voltage K1 Logic gates K1 Nanowire GAA FETs K1 Self-heating effect K1 Junctionless mode K1 Inversion mode K1 Lattice temperature SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511833 DO https://doi.org/10.1109/EDTM58488.2024.10511833 SF ELIB - SuUB Bremen
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