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1
Conductance change property of the ReRAM with Au-doped HfOx..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Tanaka, M.
;
Okayasu, S.
;
Shimizu, T.
.. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511860
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Conductance change property of the ReRAM with Au-doped HfOx switching layer under DC voltage pulses</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511860&Exemplar=1&LAN=DE A1 Tanaka, M. A1 Okayasu, S. A1 Shimizu, T. A1 Ito, T. A1 Shingubara, S. YR 2024 K1 Gold K1 Voltage measurement K1 Current-voltage characteristics K1 Doping K1 Switches K1 Ions K1 Hafnium compounds K1 RRAM K1 relaxation K1 artificial synapse SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511860 DO https://doi.org/10.1109/EDTM58488.2024.10511860 SF ELIB - SuUB Bremen
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