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A Comprehensive analysis of Interlayer variabilities in dou..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Kumar, Priyesh
;
Saha, Jhuma
- p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511926
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>A Comprehensive analysis of Interlayer variabilities in double-channel AlGaN/GaN HEMT heterostructure</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511926&Exemplar=1&LAN=DE A1 Kumar, Priyesh A1 Saha, Jhuma YR 2024 K1 Lattices K1 HEMTs K1 Market research K1 Wide band gap semiconductors K1 Manufacturing K1 MODFETs K1 III-V semiconductor materials K1 GaN K1 AlN AlGaN K1 BAlN K1 Heterostructure K1 HEMT K1 Strain K1 2DEG K1 Interlayer SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511926 DO https://doi.org/10.1109/EDTM58488.2024.10511926 SF ELIB - SuUB Bremen
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