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1
Detection of Defect Density of States in Solution-Processed..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Marothya, Himanshu
;
Acharya, Vishwas
;
Mondal, Sandip
- p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10511927
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Detection of Defect Density of States in Solution-Processed Quantum Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10511927&Exemplar=1&LAN=DE A1 Marothya, Himanshu A1 Acharya, Vishwas A1 Mondal, Sandip YR 2024 K1 Nanoparticles K1 Semiconductor device measurement K1 Electric potential K1 Voltage measurement K1 II-VI semiconductor materials K1 Energy measurement K1 Logic gates SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10511927 DO https://doi.org/10.1109/EDTM58488.2024.10511927 SF ELIB - SuUB Bremen
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