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1 Ergebnisse
1
Innovative Solution For On-Wafer RF Characterization of Hig..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Jindal, Ashish
;
Singh, Sunil
;
Singh, Poonam
.. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512043
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Innovative Solution For On-Wafer RF Characterization of High Power GaN HEMT Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512043&Exemplar=1&LAN=DE A1 Jindal, Ashish A1 Singh, Sunil A1 Singh, Poonam A1 Tomar, S.K. A1 Mishra, Meena YR 2024 K1 Radio frequency K1 Geometry K1 Power system measurements K1 Voltage measurement K1 Power measurement K1 Density measurement K1 HEMTs K1 GaN HEMT K1 Bias tee K1 High Power K1 Instability SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512043 DO https://doi.org/10.1109/EDTM58488.2024.10512043 SF ELIB - SuUB Bremen
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