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1 Ergebnisse
1
New paradigm of Yield analysis in Big Data and AI Era in Se..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
David, Jeffrey
;
Gupta, Ashutosh
;
Bamb, Rishi
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512106
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>New paradigm of Yield analysis in Big Data and AI Era in Semiconductor Manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512106&Exemplar=1&LAN=DE A1 David, Jeffrey A1 Gupta, Ashutosh A1 Bamb, Rishi A1 Akar, Said A1 Holt, Jonathan A1 Strojwas, Andrzej A1 Brozek, Tomasz YR 2024 K1 Semiconductor device modeling K1 Analytical models K1 Cloud computing K1 Soft sensors K1 Predictive models K1 Semiconductor device manufacture K1 Big Data K1 yield analysis K1 AI/ML predictive yield models SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512106 DO https://doi.org/10.1109/EDTM58488.2024.10512106 SF ELIB - SuUB Bremen
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