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1 Ergebnisse
1
Exploring Charge Trapping Dynamics in Si:HfO₂-FeFETs by Tem..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Dahan, Mor Mordechai
;
Ber, Emanuel
;
Levit, Or
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512141
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Exploring Charge Trapping Dynamics in Si:HfO₂-FeFETs by Temperature-Dependent Electrical Characterization</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512141&Exemplar=1&LAN=DE A1 Dahan, Mor Mordechai A1 Ber, Emanuel A1 Levit, Or A1 Mulaosmanovic, Halid A1 Dunkel, Stefan A1 Muller, Johannes A1 Beyer, Sven A1 Yalon, Eilam YR 2024 K1 Temperature measurement K1 Nonvolatile memory K1 Neuromorphics K1 Energy measurement K1 Time measurement K1 Threshold voltage K1 Iron K1 charge trapping K1 read-after-write delay K1 trap energy level K1 cryogenic measurements K1 FeFET K1 Si:HfO₂ SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512141 DO https://doi.org/10.1109/EDTM58488.2024.10512141 SF ELIB - SuUB Bremen
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