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1 Ergebnisse
1
NBTI Resilient Dual Mode Noise Immune Inverting Schmitt Tri..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Kannaujiya, Aryan
;
Shah, Ambika Prasad
- p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512178
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>NBTI Resilient Dual Mode Noise Immune Inverting Schmitt Trigger Circuit</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512178&Exemplar=1&LAN=DE A1 Kannaujiya, Aryan A1 Shah, Ambika Prasad YR 2024 K1 Negative bias temperature instability K1 Thermal variables control K1 Noise K1 Inverters K1 Manufacturing K1 Delays K1 Noise measurement K1 CMOS K1 Schmitt Trigger K1 Hysteresis K1 Noise Immunity K1 NBTI SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512178 DO https://doi.org/10.1109/EDTM58488.2024.10512178 SF ELIB - SuUB Bremen
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