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1 Ergebnisse
1
WKB model of ferroelectric tunnel junctions for memory appl..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Jagga, Deepali
;
De, Sourav
;
Useinov, Artur
- p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512202
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>WKB model of ferroelectric tunnel junctions for memory applications: voltage-dependent screening and electrostriction effects</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512202&Exemplar=1&LAN=DE A1 Jagga, Deepali A1 De, Sourav A1 Useinov, Artur YR 2024 K1 Performance evaluation K1 Zirconium K1 Voltage K1 Predictive models K1 Magnetic hysteresis K1 Manufacturing K1 Electrostriction K1 electrostriction effect K1 tunneling electroresistance K1 ferroelectric K1 screening K1 multi-domain barrier SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512202 DO https://doi.org/10.1109/EDTM58488.2024.10512202 SF ELIB - SuUB Bremen
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