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Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectr..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Hessler, Daniel
;
Olivo, Ricardo
;
Seidel, Konrad
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512251
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectric Field Effect Transistor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512251&Exemplar=1&LAN=DE A1 Hessler, Daniel A1 Olivo, Ricardo A1 Seidel, Konrad A1 Hoffmann, Raik A1 De, Sourav A1 Raffel, Yannick YR 2024 K1 Fluctuations K1 Zirconium K1 Charge carriers K1 Scattering K1 Doping K1 Hafnium oxide K1 Silicon K1 Flicker Noise K1 Hafnium Oxide K1 scattering factor K1 main noise source SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512251 DO https://doi.org/10.1109/EDTM58488.2024.10512251 SF ELIB - SuUB Bremen
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