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1
Expediting manufacturing safe launch with Big Data AI/ML an..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Yu, Helen
;
Martin, Scott
;
van der Meer, Laurenz
... - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512266
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Expediting manufacturing safe launch with Big Data AI/ML analytic solutions on the cloud</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512266&Exemplar=1&LAN=DE A1 Yu, Helen A1 Martin, Scott A1 van der Meer, Laurenz A1 Yang, Edward A1 Lee, Sherry A1 Xiong, Wanting YR 2024 K1 Measurement K1 Image edge detection K1 Data integrity K1 Data integration K1 Companies K1 Big Data K1 Production facilities K1 Yield Management System K1 Manufacturing K1 New Product Introduction (NPI) SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512266 DO https://doi.org/10.1109/EDTM58488.2024.10512266 SF ELIB - SuUB Bremen
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