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1 Ergebnisse
1
Enhanced optoelectronic and electrical characteristics in n..:
, In:
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Chakrabarty, Poulomi
;
Sen, Sera
;
Sahoo, Srilagna
. - p. 1-3 , 2024
Link:
https://doi.org/10.1109/EDTM58488.2024.10512332
RT T1 <cTitle>2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Enhanced optoelectronic and electrical characteristics in nanopatterned 2D dielectric (hBN)/ semiconductor (WS2) field effect transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10512332&Exemplar=1&LAN=DE A1 Chakrabarty, Poulomi A1 Sen, Sera A1 Sahoo, Srilagna A1 Lodha, Saurabh YR 2024 K1 Atomic force microscopy K1 Optical microscopy K1 Atom optics K1 Field effect transistors K1 Process control K1 Logic gates K1 Nanoscale devices K1 phototransistor K1 patterned 2D dielectric K1 p-type field effect transistor (FET) K1 RGB photo-detection SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM58488.2024.10512332 DO https://doi.org/10.1109/EDTM58488.2024.10512332 SF ELIB - SuUB Bremen
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