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1 Ergebnisse
1
Fault Detection and Classification in Semiconductor Manufac..:
, In:
2024 International Conference on Distributed Computing and Optimization Techniques (ICDCOT)
,
Reddy, S S Mohan
;
Rakesh, K
;
Aluvala, Srinivas
.. - p. 1-4 , 2024
Link:
https://doi.org/10.1109/ICDCOT61034.2024.10515343
RT T1 <cTitle>2024 International Conference on Distributed Computing and Optimization Techniques (ICDCOT)</cTitle>: T1 <Title>Fault Detection and Classification in Semiconductor Manufacturing for Sensor Screening Using Multi-Layer Deep Neural Network</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10515343&Exemplar=1&LAN=DE A1 Reddy, S S Mohan A1 Rakesh, K A1 Aluvala, Srinivas A1 Bindu, G. A1 Husseen, Ahmad YR 2024 K1 Semiconductor device modeling K1 Transmission line matrix methods K1 Fault detection K1 Printed circuits K1 Noise K1 Semiconductor device manufacture K1 Feature extraction K1 deep learning K1 gray level co-occurrence matrix K1 median filter K1 printed circuit board K1 semiconductor manufacturing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICDCOT61034.2024.10515343 DO https://doi.org/10.1109/ICDCOT61034.2024.10515343 SF ELIB - SuUB Bremen
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