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1 Ergebnisse
1
Compact expression to model the effects of dielectric absor..:
, In:
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
,
Saro, Simone
;
Palestri, Pierpaolo
;
Caruso, Enrico
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ICMTS59902.2024.10520681
RT T1 <cTitle>2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)</cTitle>: T1 <Title>Compact expression to model the effects of dielectric absorption on analog-to-digital converters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10520681&Exemplar=1&LAN=DE A1 Saro, Simone A1 Palestri, Pierpaolo A1 Caruso, Enrico A1 Toniutti, Paolo A1 Calabro, Rocco A1 Terokhin, Semen A1 Driussi, Francesco YR 2024 SN 2158-1029 K1 Analytical models K1 Time-frequency analysis K1 Absorption K1 Capacitors K1 Measurement uncertainty K1 Predictive models K1 Mathematical models SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS59902.2024.10520681 DO https://doi.org/10.1109/ICMTS59902.2024.10520681 SF ELIB - SuUB Bremen
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