I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Analysis and Compensation of the Series Resistance Effects ..:
, In:
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
,
Massarotto, Marco
;
Driussi, Francesco
;
Bucovaz, Mattia
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ICMTS59902.2024.10520684
RT T1 <cTitle>2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)</cTitle>: T1 <Title>Analysis and Compensation of the Series Resistance Effects on the Characteristics of Ferroelectric Capacitors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10520684&Exemplar=1&LAN=DE A1 Massarotto, Marco A1 Driussi, Francesco A1 Bucovaz, Mattia A1 Affanni, Antonio A1 Lancaster, Suzanne A1 Slesazeck, Stefan A1 Mikolajick, Thomas A1 Esseni, David YR 2024 SN 2158-1029 K1 Resistance K1 Statistical analysis K1 Capacitors K1 Switches K1 Iron K1 Frequency measurement K1 Microelectronics SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS59902.2024.10520684 DO https://doi.org/10.1109/ICMTS59902.2024.10520684 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
