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1 Ergebnisse
1
Impedance Measurement Platform for Statistical Capacitance ..:
, In:
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
,
Saito, Koga
;
Suzuki, Tatsuhiko
;
Mitsuda, Hidemi
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/ICMTS59902.2024.10520692
RT T1 <cTitle>2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)</cTitle>: T1 <Title>Impedance Measurement Platform for Statistical Capacitance and Current Characteristic Measurements of Arrayed Cells with Atto-order Precision</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10520692&Exemplar=1&LAN=DE A1 Saito, Koga A1 Suzuki, Tatsuhiko A1 Mitsuda, Hidemi A1 Nozaki, Tsubasa A1 Mawaki, Takezo A1 Kuroda, Rihito YR 2024 SN 2158-1029 K1 Performance evaluation K1 Semiconductor device measurement K1 Impedance measurement K1 Current measurement K1 Capacitance-voltage characteristics K1 Semiconductor devices K1 Capacitance K1 Capacitor K1 current K1 statistical measurement K1 array test circuit K1 platform SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS59902.2024.10520692 DO https://doi.org/10.1109/ICMTS59902.2024.10520692 SF ELIB - SuUB Bremen
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