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1 Ergebnisse
1
Efficient Characterization Methodology for Low-Frequency No..:
, In:
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
,
Pirro, Luca
;
Chohan, Talha
;
Liebscher, Philipp
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ICMTS59902.2024.10520698
RT T1 <cTitle>2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)</cTitle>: T1 <Title>Efficient Characterization Methodology for Low-Frequency Noise Monitoring</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10520698&Exemplar=1&LAN=DE A1 Pirro, Luca A1 Chohan, Talha A1 Liebscher, Philipp A1 Juettner, Maximilian A1 Holzmueller, Felix A1 Jain, Ruchil A1 Raffel, Yannick A1 Seidel, Konrad A1 Olivo, Ricardo Revello A1 Zaka, Alban A1 Hoentschel, Jan YR 2024 SN 2158-1029 K1 Temperature measurement K1 Temperature sensors K1 Fluctuations K1 Current measurement K1 Logic gates K1 Mathematical models K1 Time measurement SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS59902.2024.10520698 DO https://doi.org/10.1109/ICMTS59902.2024.10520698 SF ELIB - SuUB Bremen
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