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1 Ergebnisse
1
Transistor Matrix Array for Measuring Variability and Rando..:
, In:
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
,
Mizutani, Tomoko
;
Takeuchi, Kiyoshi
;
Saraya, Takuya
... - p. 1-5 , 2024
Link:
https://doi.org/10.1109/ICMTS59902.2024.10520700
RT T1 <cTitle>2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)</cTitle>: T1 <Title>Transistor Matrix Array for Measuring Variability and Random Telegraph Noise at Cryogenic Temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10520700&Exemplar=1&LAN=DE A1 Mizutani, Tomoko A1 Takeuchi, Kiyoshi A1 Saraya, Takuya A1 Oka, Hiroshi A1 Mori, Takahiro A1 Kobayashi, Masaharu A1 Hiramoro, Toshiro YR 2024 SN 2158-1029 K1 Temperature K1 Current measurement K1 Noise K1 Field effect transistors K1 Cryogenics K1 Measurement techniques K1 Time measurement K1 Cryogenic K1 CMOS K1 variability K1 random telegraph noise (RTN) SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS59902.2024.10520700 DO https://doi.org/10.1109/ICMTS59902.2024.10520700 SF ELIB - SuUB Bremen
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