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1 Ergebnisse
1
TID Testing of SiGe Microelectronics Using High-Flux 1-MeV ..:
, In:
2024 IEEE Aerospace Conference
,
Brumbach, Zachary R.
;
Teng, Jeffrey W.
;
Nergui, Delgermaa
... - p. 1-9 , 2024
Link:
https://doi.org/10.1109/AERO58975.2024.10521075
RT T1
2024 IEEE Aerospace Conference
: T1
TID Testing of SiGe Microelectronics Using High-Flux 1-MeV Electrons for Europa-Surface Missions
UL https://suche.suub.uni-bremen.de/peid=ieee-10521075&Exemplar=1&LAN=DE A1 Brumbach, Zachary R. A1 Teng, Jeffrey W. A1 Nergui, Delgermaa A1 Heimerl, Justin P. A1 Ringel, Brett L. A1 Mensah, Yaw A. A1 Sam, Delwyn G. A1 Moody, Jackson P. A1 Blalock, Benjamin J. A1 Thorburn, Dennis O. A1 Del Castillo, Linda A1 Mojarradi, Mohammad M. A1 Cressler, John D. YR 2024 K1 Ionizing radiation K1 Laboratories K1 Space radiation K1 Cryogenics K1 Propulsion K1 Linear particle accelerator K1 Microelectronics SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/AERO58975.2024.10521075 DO https://doi.org/10.1109/AERO58975.2024.10521075 SF ELIB - SuUB Bremen
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