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1 Ergebnisse
1
Fast Current Constraints Generation for Chip Safety:
, In:
2024 25th International Symposium on Quality Electronic Design (ISQED)
,
Feghali, Cedric
;
Najm, Farid N.
- p. 1-8 , 2024
Link:
https://doi.org/10.1109/ISQED60706.2024.10528365
RT T1 <cTitle>2024 25th International Symposium on Quality Electronic Design (ISQED)</cTitle>: T1 <Title>Fast Current Constraints Generation for Chip Safety</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10528365&Exemplar=1&LAN=DE A1 Feghali, Cedric A1 Najm, Farid N. YR 2024 SN 1948-3295 K1 Electromigration K1 Measurement K1 Computational modeling K1 Reliability engineering K1 Power grids K1 Safety K1 Computational efficiency K1 power grid K1 void K1 current constraints K1 model order reduction K1 Arnoldi SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/ISQED60706.2024.10528365 DO https://doi.org/10.1109/ISQED60706.2024.10528365 SF ELIB - SuUB Bremen
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